Monthly Archives: July 2015

Congratulations to Dr. Run Huang!

Dr. Run Huang successfully defended her dissertation, “High Precision Optical Surface Metrology using Deflectometry.”, on July 27th, 2015.  Congratulations, and please see her other publications for more detail on her work.

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SLOTS System Published in SPIE Newsroom

The SLOTS system, developed by LOFT group alumni Dr. Tianquan Su, has gained recognition through a new SPIE newsroom article. The publication presents a layperson description of the SLOTS system and how its novel IR deflectometery approach has been successful … Continue reading

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