The SLOTS system, developed by LOFT group alumni Dr. Tianquan Su, has gained recognition through a new SPIE newsroom article. The publication presents a layperson description of the SLOTS system and how its novel IR deflectometery approach has been successful as accurately and rapidly measuring freeform optics which allows for a faster manufacturing process. The article also discusses future potential applications. You can read it at SPIE.
Source: SPIE Newsroom